Baosheng Wang, Yuejian Wu, André Ivanov. Designs for Reducing Test Time of Distributed Small Embedded SRAMs. In 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings. pages 120-128, IEEE Computer Society, 2004. [doi]
Abstract is missing.