Mingjun Wang, Hui Wang, Zizhen Liu, Feng Gu, Jianan Mu, Jiaping Tang, Jun Gao, Huawei Li 0001, Jing Ye 0001, Xiaowei Li 0001. ETPG: Efficient Transition Fault Simulation via Dual-Strategy Pattern Parallelism and Gate Restructuring. In Yuichi Nakamura 0002, Yu Wang 0002, editors, Proceedings of the 30th Asia and South Pacific Design Automation Conference, ASPDAC 2025, Tokyo, Japan, January 20-23, 2025. pages 1321-1327, ACM, 2025. [doi]
Abstract is missing.