Power/ground supply voltage variation-aware delay test pattern generation

Lu Wang, Xutao Wang, Milad Maleki, Bao Liu. Power/ground supply voltage variation-aware delay test pattern generation. In IEEE 32nd VLSI Test Symposium, VTS 2014, Napa, CA, USA, April 13-17, 2014. pages 1-6, IEEE, 2014. [doi]

Abstract

Abstract is missing.