A Low Overhead High Test Compression Technique Using Pattern Clustering With n -Detection Test Support

Seongmoon Wang, Wenlong Wei, Zhanglei Wang. A Low Overhead High Test Compression Technique Using Pattern Clustering With n -Detection Test Support. IEEE Trans. VLSI Syst., 18(12):1672-1685, 2010. [doi]

Authors

Seongmoon Wang

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Wenlong Wei

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Zhanglei Wang

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