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Seongmoon Wang, Wenlong Wei, Zhanglei Wang. A Low Overhead High Test Compression Technique Using Pattern Clustering With n -Detection Test Support. IEEE Trans. VLSI Syst., 18(12):1672-1685, 2010. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: Low Overhead Partial Enhanced Scan Technique for Compact and High Fault Coverage Transition Delay Test PatternsSeongmoon Wang, Wenlong Wei. ets 2008: 125-130 [doi] Hybrid Delay Scan: A Low Hardware Overhead Scan-Based Delay Test Technique for High Fault Coverage and Compact Test SetsSeongmoon Wang, Xiao Liu, Srimat T. Chakradhar. date 2004: 1296-1301 [doi]
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