Zirui Wang, Haoran Wang, Yuxiao Wang, Zixuan Sun, Lang Zeng, Runsheng Wang, Ru Huang 0001. New Insights into the Random Telegraph Noise (RTN) in FinFETs at Cryogenic Temperature. In IEEE International Reliability Physics Symposium, IRPS 2024, Grapevine, TX, USA, April 14-18, 2024. pages 6, IEEE, 2024. [doi]
Abstract is missing.