Wenping Wang, Zile Wei, Shengqi Yang, Yu Cao. An efficient method to identify critical gates under circuit aging. In Georges G. E. Gielen, editor, 2007 International Conference on Computer-Aided Design (ICCAD 07), November 5-8, 2007, San Jose, CA, USA. pages 735-740, IEEE, 2007. [doi]
Abstract is missing.