Test/Repair Area Overhead Reduction for Small Embedded SRAMs

Baosheng Wang, Qiang Xu. Test/Repair Area Overhead Reduction for Small Embedded SRAMs. In 15th Asian Test Symposium, ATS 2006, Fukuoka, Japan, November 20-23, 2006. pages 37-44, IEEE, 2006. [doi]

Abstract

Abstract is missing.