Yong-sheng Wang, Liyi Xiao, Mingyan Yu, Jinxiang Wang, Yizheng Ye. A Test Architecture for System-on-a-Chip. In 12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China. pages 506, IEEE Computer Society, 2003. [doi]
@inproceedings{WangXYWY03,
title = {A Test Architecture for System-on-a-Chip},
author = {Yong-sheng Wang and Liyi Xiao and Mingyan Yu and Jinxiang Wang and Yizheng Ye},
year = {2003},
url = {http://csdl.computer.org/comp/proceedings/ats/2003/1951/00/19510506abs.htm},
tags = {architecture, testing},
researchr = {https://researchr.org/publication/WangXYWY03},
cites = {0},
citedby = {0},
pages = {506},
booktitle = {12th Asian Test Symposium (ATS 2003), 17-19 November 2003, Xian, China},
publisher = {IEEE Computer Society},
isbn = {0-7695-1951-2},
}