Zheng Wang, Hanbin Ying, Nujhat Tasneem, Anthony Gaskell, John D. Cressler, Martin Mourigal, Asif I. Khan. Cryogenic Characterization of Antiferroelectric Zirconia down to 50 mK. In Device Research Conference, DRC 2019, Ann Arbor, MI, USA, June 23-26, 2019. pages 85-86, IEEE, 2019. [doi]
@inproceedings{WangYTGCMK19,
title = {Cryogenic Characterization of Antiferroelectric Zirconia down to 50 mK},
author = {Zheng Wang and Hanbin Ying and Nujhat Tasneem and Anthony Gaskell and John D. Cressler and Martin Mourigal and Asif I. Khan},
year = {2019},
doi = {10.1109/DRC46940.2019.9046475},
url = {https://doi.org/10.1109/DRC46940.2019.9046475},
researchr = {https://researchr.org/publication/WangYTGCMK19},
cites = {0},
citedby = {0},
pages = {85-86},
booktitle = {Device Research Conference, DRC 2019, Ann Arbor, MI, USA, June 23-26, 2019},
publisher = {IEEE},
isbn = {978-1-7281-2112-3},
}