Secure Scan and Test Using Obfuscation Throughout Supply Chain

Xiaoxiao Wang, Dongrong Zhang, Miao Tony He, Donglin Su, Mark Tehranipoor. Secure Scan and Test Using Obfuscation Throughout Supply Chain. IEEE Trans. on CAD of Integrated Circuits and Systems, 37(9):1867-1880, 2018. [doi]

Abstract

Abstract is missing.