Multi-Depth-of-Field 3-D Profilometry for a Microscopic System With Telecentric Lens

Xianshun Wang, Dongchen Zhu, Wenjun Shi, Jun Liu, Fengjie Fu, Jiamao Li, Xiaolin Zhang. Multi-Depth-of-Field 3-D Profilometry for a Microscopic System With Telecentric Lens. IEEE T. Instrumentation and Measurement, 71:1-9, 2022. [doi]

Authors

Xianshun Wang

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Dongchen Zhu

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Wenjun Shi

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Jun Liu

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Fengjie Fu

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Jiamao Li

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Xiaolin Zhang

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