Xianshun Wang, Dongchen Zhu, Wenjun Shi, Jun Liu, Fengjie Fu, Jiamao Li, Xiaolin Zhang. Multi-Depth-of-Field 3-D Profilometry for a Microscopic System With Telecentric Lens. IEEE T. Instrumentation and Measurement, 71:1-9, 2022. [doi]
Abstract is missing.