Xianshun Wang, Dongchen Zhu, Wenjun Shi, Jun Liu, Fengjie Fu, Jiamao Li, Xiaolin Zhang. Multi-Depth-of-Field 3-D Profilometry for a Microscopic System With Telecentric Lens. IEEE T. Instrumentation and Measurement, 71:1-9, 2022. [doi]
@article{WangZSLFLZ22,
title = {Multi-Depth-of-Field 3-D Profilometry for a Microscopic System With Telecentric Lens},
author = {Xianshun Wang and Dongchen Zhu and Wenjun Shi and Jun Liu and Fengjie Fu and Jiamao Li and Xiaolin Zhang},
year = {2022},
doi = {10.1109/TIM.2021.3137156},
url = {https://doi.org/10.1109/TIM.2021.3137156},
researchr = {https://researchr.org/publication/WangZSLFLZ22},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {71},
pages = {1-9},
}