A SAT-based diagnosis pattern generation method for timing faults in scan chains - researchr publication authors

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Da Wang, Lunkai Zhang, Weizhi Xu, Dongrui Fan, Fei Wang. A SAT-based diagnosis pattern generation method for timing faults in scan chains. In 2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea (South), May 20-23, 2012. pages 2308-2312, IEEE, 2012. [doi]

This author has not been identified. Look up 'Da Wang' in GoogleThis author has not been identified. Look up 'Lunkai Zhang' in GoogleThis author has not been identified. Look up 'Weizhi Xu' in GoogleThis author has not been identified. Look up 'Dongrui Fan' in GoogleThis author has not been identified. Look up 'Fei Wang' in Google

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