Da Wang, Lunkai Zhang, Weizhi Xu, Dongrui Fan, Fei Wang. A SAT-based diagnosis pattern generation method for timing faults in scan chains. In 2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea (South), May 20-23, 2012. pages 2308-2312, IEEE, 2012. [doi]
@inproceedings{WangZXFW12,
title = {A SAT-based diagnosis pattern generation method for timing faults in scan chains},
author = {Da Wang and Lunkai Zhang and Weizhi Xu and Dongrui Fan and Fei Wang},
year = {2012},
doi = {10.1109/ISCAS.2012.6271756},
url = {http://dx.doi.org/10.1109/ISCAS.2012.6271756},
researchr = {https://researchr.org/publication/WangZXFW12},
cites = {0},
citedby = {0},
pages = {2308-2312},
booktitle = {2012 IEEE International Symposium on Circuits and Systems, ISCAS 2012, Seoul, Korea (South), May 20-23, 2012},
publisher = {IEEE},
isbn = {978-1-4673-0218-0},
}