Analytical models for the thermal strain and stress induced by annular through-silicon-via (TSV)

Fengjuan Wang, Zhangming Zhu, Yintang Yang, Xiaoxian Liu, Ruixue Ding. Analytical models for the thermal strain and stress induced by annular through-silicon-via (TSV). IEICE Electronic Express, 10(20):20130666, 2013. [doi]

Abstract

Abstract is missing.