Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Fengjuan Wang, Zhangming Zhu, Yintang Yang, Xiaoxian Liu, Ruixue Ding. Capacitance characterization of tapered through-silicon-via considering MOS effect. Microelectronics Journal, 45(2):205-210, 2014. [doi]
Abstract is missing.