Lifetime prediction and analysis of AlGaN/GaN HEMT devices under temperature stress

Baozhu Wang, Jinyuan Zhao, Ming Zhang, Lin Yang 0006, Jianchao Wang, Weimin Hou. Lifetime prediction and analysis of AlGaN/GaN HEMT devices under temperature stress. Microelectronics Journal, 121:105370, 2022. [doi]

Abstract

Abstract is missing.