Thomas G. Waring, Gerard A. Allan, Anthony J. Walton. Integration of DFM Techniques and Design Automation. In 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 1996, Boston, MA, USA, November 6-8, 1996. pages 59-67, IEEE Computer Society, 1996. [doi]
Abstract is missing.