Thomas P. Warwick, Gustavo Rivera, David Waite, James Russell, Jeffrey Smith. Measurement Repeatability for RF Test Within the Load-board Constraints of High Density and Fine Pitch SOC Applications. In Douglas Young, Nur A. Touba, editors, 2008 IEEE International Test Conference, ITC 2008, Santa Clara, California, USA, October 26-31, 2008. pages 1-10, IEEE, 2008. [doi]
Abstract is missing.