Takamoto Watanabe. All-Digital VCO-ADC TAD Confirming Scaling and Stochastic Effects Using 16-nm FinFET CMOS. In 28th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2021, Dubai, United Arab Emirates, November 28 - Dec. 1, 2021. pages 1-4, IEEE, 2021. [doi]
@inproceedings{Watanabe21a, title = {All-Digital VCO-ADC TAD Confirming Scaling and Stochastic Effects Using 16-nm FinFET CMOS}, author = {Takamoto Watanabe}, year = {2021}, doi = {10.1109/ICECS53924.2021.9665569}, url = {https://doi.org/10.1109/ICECS53924.2021.9665569}, researchr = {https://researchr.org/publication/Watanabe21a}, cites = {0}, citedby = {0}, pages = {1-4}, booktitle = {28th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2021, Dubai, United Arab Emirates, November 28 - Dec. 1, 2021}, publisher = {IEEE}, isbn = {978-1-7281-8281-0}, }