All-Digital VCO-ADC TAD Confirming Scaling and Stochastic Effects Using 16-nm FinFET CMOS - researchr publication

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Takamoto Watanabe. All-Digital VCO-ADC TAD Confirming Scaling and Stochastic Effects Using 16-nm FinFET CMOS. In 28th IEEE International Conference on Electronics, Circuits, and Systems, ICECS 2021, Dubai, United Arab Emirates, November 28 - Dec. 1, 2021. pages 1-4, IEEE, 2021. [doi]

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