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Design and Heavy-Ion Testing of MTJ/CMOS Hybrid LSIs for Space-Grade Soft-Error Reliability

K. Watanabe, T. Shimada, K. Hirose, H. Shindo, D. Kobayashi, Takaho Tanigawa, Shoji Ikeda, Takamitsu Shinada, Hiroki Koike, Tetsuo Endoh, T. Makino, Takeshi Ohshima. Design and Heavy-Ion Testing of MTJ/CMOS Hybrid LSIs for Space-Grade Soft-Error Reliability. In IEEE International Reliability Physics Symposium, IRPS 2022, Dallas, TX, USA, March 27-31, 2022. pages 54-1, IEEE, 2022. [doi]

Authors

K. Watanabe

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T. Shimada

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K. Hirose

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H. Shindo

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D. Kobayashi

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Takaho Tanigawa

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Shoji Ikeda

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Takamitsu Shinada

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Hiroki Koike

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Tetsuo Endoh

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T. Makino

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Takeshi Ohshima

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