An SPU reference model for simulation, random test generation and verification

Yukio Watanabe, Balazs Sallay, Brad W. Michael, Daniel A. Brokenshire, Gavin Meil, Hazim Shafi, Daisuke Hiraoka. An SPU reference model for simulation, random test generation and verification. In Fumiyasu Hirose, editor, Proceedings of the 2006 Conference on Asia South Pacific Design Automation: ASP-DAC 2006, Yokohama, Japan, January 24-27, 2006. pages 860-866, IEEE, 2006. [doi]

Abstract

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