Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Stephan Weber, Tiago Ressurreicao, Candido Duarte. Yield Prediction With a New Generalized Process Capability Index Applicable to Non-Normal Data. IEEE Trans. on CAD of Integrated Circuits and Systems, 35(6):931-942, 2016. [doi]
Abstract is missing.