Biasing techniques for subthreshold MOS resistive grids

Keng Hoong Wee, Ji-Jon Sit, Rahul Sarpeshkar. Biasing techniques for subthreshold MOS resistive grids. In International Symposium on Circuits and Systems (ISCAS 2005), 23-26 May 2005, Kobe, Japan. pages 2164-2167, IEEE, 2005. [doi]

Authors

Keng Hoong Wee

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Ji-Jon Sit

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Rahul Sarpeshkar

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