Keng Hoong Wee, Ji-Jon Sit, Rahul Sarpeshkar. Biasing techniques for subthreshold MOS resistive grids. In International Symposium on Circuits and Systems (ISCAS 2005), 23-26 May 2005, Kobe, Japan. pages 2164-2167, IEEE, 2005. [doi]
@inproceedings{WeeSS05,
title = {Biasing techniques for subthreshold MOS resistive grids},
author = {Keng Hoong Wee and Ji-Jon Sit and Rahul Sarpeshkar},
year = {2005},
doi = {10.1109/ISCAS.2005.1465049},
url = {http://dx.doi.org/10.1109/ISCAS.2005.1465049},
researchr = {https://researchr.org/publication/WeeSS05},
cites = {0},
citedby = {0},
pages = {2164-2167},
booktitle = {International Symposium on Circuits and Systems (ISCAS 2005), 23-26 May 2005, Kobe, Japan},
publisher = {IEEE},
}