Overcoming Test Setup Limitations by Applying Model-Based Testing to High-Precision ADCs

Carsten Wegener, Michael Peter Kennedy. Overcoming Test Setup Limitations by Applying Model-Based Testing to High-Precision ADCs. J. Electronic Testing, 21(3):299-310, 2005. [doi]

Authors

Carsten Wegener

This author has not been identified. Look up 'Carsten Wegener' in Google

Michael Peter Kennedy

This author has not been identified. Look up 'Michael Peter Kennedy' in Google