Carsten Wegener, Michael Peter Kennedy. Overcoming Test Setup Limitations by Applying Model-Based Testing to High-Precision ADCs. J. Electronic Testing, 21(3):299-310, 2005. [doi]
@article{WegenerK05,
title = {Overcoming Test Setup Limitations by Applying Model-Based Testing to High-Precision ADCs},
author = {Carsten Wegener and Michael Peter Kennedy},
year = {2005},
doi = {10.1007/s10836-005-6359-3},
url = {http://dx.doi.org/10.1007/s10836-005-6359-3},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/WegenerK05},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {21},
number = {3},
pages = {299-310},
}