Local-global lightweight ViT model for mini/micro-LED-chip defect recognition

Linyu Wei, Jueping Cai, Kailin Wen, Chengkai Zhang. Local-global lightweight ViT model for mini/micro-LED-chip defect recognition. Eng. Appl. of AI, 123(Part A):106247, 2023. [doi]

Authors

Linyu Wei

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Jueping Cai

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Kailin Wen

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Chengkai Zhang

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