Linyu Wei, Jueping Cai, Kailin Wen, Chengkai Zhang. Local-global lightweight ViT model for mini/micro-LED-chip defect recognition. Eng. Appl. of AI, 123(Part A):106247, 2023. [doi]
@article{WeiCWZ23,
title = {Local-global lightweight ViT model for mini/micro-LED-chip defect recognition},
author = {Linyu Wei and Jueping Cai and Kailin Wen and Chengkai Zhang},
year = {2023},
doi = {10.1016/j.engappai.2023.106247},
url = {https://doi.org/10.1016/j.engappai.2023.106247},
researchr = {https://researchr.org/publication/WeiCWZ23},
cites = {0},
citedby = {0},
journal = {Eng. Appl. of AI},
volume = {123},
number = {Part A},
pages = {106247},
}