Local-global lightweight ViT model for mini/micro-LED-chip defect recognition

Linyu Wei, Jueping Cai, Kailin Wen, Chengkai Zhang. Local-global lightweight ViT model for mini/micro-LED-chip defect recognition. Eng. Appl. of AI, 123(Part A):106247, 2023. [doi]

Abstract

Abstract is missing.