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Complete Tests in Algorithm-Based Fault-Tolerant Matrix Operations on Processor Arrays

Dah-Yea Wei, Jung Hwan Kim, T. R. N. Rao. Complete Tests in Algorithm-Based Fault-Tolerant Matrix Operations on Processor Arrays. In Fabrizio Lombardi, Mariagiovanna Sami, Yvon Savaria, Renato Stefanelli, editors, The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 27-29, 1993, Venice, Italy, Proceedings. pages 255-262, IEEE Computer Society, 1993.

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