Roundoff Error-Free Tests in Algorithm-Based Fault Tolerant Matrix Operations on 2-D Processor Arrays - researchr publication

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Dah-Yea Wei, Jung Hwan Kim, T. R. N. Rao. Roundoff Error-Free Tests in Algorithm-Based Fault Tolerant Matrix Operations on 2-D Processor Arrays. In The IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, October 17-19, 1994, Montréal, Quebec, Canada, Proceedings. pages 74-82, IEEE Computer Society, 1994.

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