Shugang Wei, Kensuke Shimizu. Error Detection of Arithmetic Circuits Using a Residue Checker with Signed-Digit Number System. In 16th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2001), 24-26 October 2001, San Francisco, CA, USA, Proceedings. pages 72-77, IEEE Computer Society, 2001. [doi]
Abstract is missing.