The Local Geometry of Testing in Ellipses: Tight Control via Localized Kolmogorov Widths

Yuting Wei, Martin J. Wainwright. The Local Geometry of Testing in Ellipses: Tight Control via Localized Kolmogorov Widths. IEEE Transactions on Information Theory, 66(8):5110-5129, 2020. [doi]

Authors

Yuting Wei

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Martin J. Wainwright

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