Yuting Wei, Martin J. Wainwright. The Local Geometry of Testing in Ellipses: Tight Control via Localized Kolmogorov Widths. IEEE Transactions on Information Theory, 66(8):5110-5129, 2020. [doi]
@article{WeiW20-2,
title = {The Local Geometry of Testing in Ellipses: Tight Control via Localized Kolmogorov Widths},
author = {Yuting Wei and Martin J. Wainwright},
year = {2020},
doi = {10.1109/TIT.2020.2981313},
url = {https://doi.org/10.1109/TIT.2020.2981313},
researchr = {https://researchr.org/publication/WeiW20-2},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Information Theory},
volume = {66},
number = {8},
pages = {5110-5129},
}