Christoph Weimer, Xiaodi Jin, Gerhard G. Fischer, Michael Schröter. Characterization of Dynamic Large-Signal Operating Limits and Long-Term RF Reliability of SiGe HBTs. In 2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS 2022, Phoenix, AZ, USA, October 16-19, 2022. pages 216-223, IEEE, 2022. [doi]
Abstract is missing.