Christoph Weimer, Paulius Sakalas, M. Müller, G. G. Fischer, Michael Schröter. An Experimental Load-Pull Based Large-Signal RF Reliability Study of SiGe HBTs. In IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium, BCICTS 2021, Monterey, CA, USA, December 5-8, 2021. pages 1-4, IEEE, 2021. [doi]
Abstract is missing.