Retention time measurements and modelling of bit error rates of WIDE I/O DRAM in MPSoCs - researchr publication authors

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Christian Weis, Matthias Jung 0001, Peter Ehses, Cristiano Santos, Pascal Vivet, Sven Goossens, Martijn Koedam, Norbert Wehn. Retention time measurements and modelling of bit error rates of WIDE I/O DRAM in MPSoCs. In Wolfgang Nebel, David Atienza, editors, Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015. pages 495-500, ACM, 2015. [doi]

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