Christian Weis, Matthias Jung 0001, Peter Ehses, Cristiano Santos, Pascal Vivet, Sven Goossens, Martijn Koedam, Norbert Wehn. Retention time measurements and modelling of bit error rates of WIDE I/O DRAM in MPSoCs. In Wolfgang Nebel, David Atienza, editors, Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015. pages 495-500, ACM, 2015. [doi]
@inproceedings{Weis0ESVGKW15,
title = {Retention time measurements and modelling of bit error rates of WIDE I/O DRAM in MPSoCs},
author = {Christian Weis and Matthias Jung 0001 and Peter Ehses and Cristiano Santos and Pascal Vivet and Sven Goossens and Martijn Koedam and Norbert Wehn},
year = {2015},
url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=7092439},
researchr = {https://researchr.org/publication/Weis0ESVGKW15},
cites = {0},
citedby = {0},
pages = {495-500},
booktitle = {Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015},
editor = {Wolfgang Nebel and David Atienza},
publisher = {ACM},
isbn = {978-3-9815370-4-8},
}