Yoav Weizman, Yefim Fefer, Sergey Sofer, Ezra Baruch. Investigation of on-chip PLL irregularities under stress conditions - case study. In Proceedings of the 2004 11th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2004, Tel Aviv, Israel, December 13-15, 2004. pages 591-594, IEEE, 2004. [doi]
Abstract is missing.