External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Tags

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

Effect of oval defects in GaAs on the reliability of SiN::x:: metal-insulator-metal capacitors

P. J. van der Wel, J. R. de Beer, R. J. M. van Boxtel, Y. Y. Hsieh, Y. C. Wang. Effect of oval defects in GaAs on the reliability of SiN::x:: metal-insulator-metal capacitors. Microelectronics Reliability, 47(8):1188-1193, 2007. [doi]

Authors

P. J. van der Wel

This author has not been identified. Look up 'P. J. van der Wel' in Google

J. R. de Beer

This author has not been identified. Look up 'J. R. de Beer' in Google

R. J. M. van Boxtel

This author has not been identified. Look up 'R. J. M. van Boxtel' in Google

Y. Y. Hsieh

This author has not been identified. Look up 'Y. Y. Hsieh' in Google

Y. C. Wang

This author has not been identified. Look up 'Y. C. Wang' in Google
runs on