P. J. van der Wel, J. R. de Beer, R. J. M. van Boxtel, Y. Y. Hsieh, Y. C. Wang. Effect of oval defects in GaAs on the reliability of SiN::x:: metal-insulator-metal capacitors. Microelectronics Reliability, 47(8):1188-1193, 2007. [doi]
@article{WelBBHW07,
title = {Effect of oval defects in GaAs on the reliability of SiN::x:: metal-insulator-metal capacitors},
author = {P. J. van der Wel and J. R. de Beer and R. J. M. van Boxtel and Y. Y. Hsieh and Y. C. Wang},
year = {2007},
doi = {10.1016/j.microrel.2007.01.089},
url = {http://dx.doi.org/10.1016/j.microrel.2007.01.089},
tags = {C++, reliability},
researchr = {https://researchr.org/publication/WelBBHW07},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {47},
number = {8},
pages = {1188-1193},
}