An innovative standard cells remapping method for in-circuit critical parameters monitoring - researchr publication authors

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Loic Welter, Philippe Dreux, Hassen Aziza, Jean Michel Portal. An innovative standard cells remapping method for in-circuit critical parameters monitoring. In 2014 IEEE 20th International On-Line Testing Symposium, IOLTS 2014, Platja d'Aro, Girona, Spain, July 7-9, 2014. pages 206-209, IEEE, 2014. [doi]

This author has not been identified. Look up 'Loic Welter' in GoogleThis author has not been identified. Look up 'Philippe Dreux' in GoogleThis author has not been identified. Look up 'Hassen Aziza' in GoogleThis author has not been identified. Look up 'Jean Michel Portal' in Google

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