YuanLin Wen, Sheng-Luen Chung, Li-Der Jeng, MuDer Jeng. Intelligent Design of Diagnosable Systems: A Case Study of Semiconductor Manufacturing Machines. In Bruno Apolloni, Robert J. Howlett, Lakhmi C. Jain, editors, Knowledge-Based Intelligent Information and Engineering Systems, 11th International Conference, KES 2007, XVII Italian Workshop on Neural Networks, Vietri sul Mare, Italy, September 12-14, 2007. Proceedings, Part II. Volume 4693 of Lecture Notes in Computer Science, pages 877-884, Springer, 2007. [doi]
@inproceedings{WenCJJ07, title = {Intelligent Design of Diagnosable Systems: A Case Study of Semiconductor Manufacturing Machines}, author = {YuanLin Wen and Sheng-Luen Chung and Li-Der Jeng and MuDer Jeng}, year = {2007}, doi = {10.1007/978-3-540-74827-4_110}, url = {http://dx.doi.org/10.1007/978-3-540-74827-4_110}, tags = {case study, design}, researchr = {https://researchr.org/publication/WenCJJ07}, cites = {0}, citedby = {0}, pages = {877-884}, booktitle = {Knowledge-Based Intelligent Information and Engineering Systems, 11th International Conference, KES 2007, XVII Italian Workshop on Neural Networks, Vietri sul Mare, Italy, September 12-14, 2007. Proceedings, Part II}, editor = {Bruno Apolloni and Robert J. Howlett and Lakhmi C. Jain}, volume = {4693}, series = {Lecture Notes in Computer Science}, publisher = {Springer}, isbn = {978-3-540-74826-7}, }