A Novel ATPG Method for Capture Power Reduction during Scan Testing

Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Tatsuya Suzuki, Kewal K. Saluja, Laung-Terng Wang, Kozo Kinoshita. A Novel ATPG Method for Capture Power Reduction during Scan Testing. IEICE Transactions, 90-D(9):1398-1405, 2007. [doi]

Authors

Xiaoqing Wen

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Seiji Kajihara

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Kohei Miyase

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Tatsuya Suzuki

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Kewal K. Saluja

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Laung-Terng Wang

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Kozo Kinoshita

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