Xiaoqing Wen, Seiji Kajihara, Kohei Miyase, Tatsuya Suzuki, Kewal K. Saluja, Laung-Terng Wang, Kozo Kinoshita. A Novel ATPG Method for Capture Power Reduction during Scan Testing. IEICE Transactions, 90-D(9):1398-1405, 2007. [doi]
@article{WenKMSSWK07,
title = {A Novel ATPG Method for Capture Power Reduction during Scan Testing},
author = {Xiaoqing Wen and Seiji Kajihara and Kohei Miyase and Tatsuya Suzuki and Kewal K. Saluja and Laung-Terng Wang and Kozo Kinoshita},
year = {2007},
doi = {10.1093/ietisy/e90-d.9.1398},
url = {http://dx.doi.org/10.1093/ietisy/e90-d.9.1398},
tags = {testing},
researchr = {https://researchr.org/publication/WenKMSSWK07},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {90-D},
number = {9},
pages = {1398-1405},
}