Wujie Wen, Mengjie Mao, Hai Li, Yiran Chen, Yukui Pei, Ning Ge. A holistic tri-region MLC STT-RAM design with combined performance, energy, and reliability optimizations. In Luca Fanucci, Jürgen Teich, editors, 2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016. pages 1285-1290, IEEE, 2016. [doi]
@inproceedings{WenMLCPG16,
title = {A holistic tri-region MLC STT-RAM design with combined performance, energy, and reliability optimizations},
author = {Wujie Wen and Mengjie Mao and Hai Li and Yiran Chen and Yukui Pei and Ning Ge},
year = {2016},
url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=7459508},
researchr = {https://researchr.org/publication/WenMLCPG16},
cites = {0},
citedby = {0},
pages = {1285-1290},
booktitle = {2016 Design, Automation & Test in Europe Conference & Exhibition, DATE 2016, Dresden, Germany, March 14-18, 2016},
editor = {Luca Fanucci and Jürgen Teich},
publisher = {IEEE},
isbn = {978-3-9815-3707-9},
}